Subject: Re: Taking into account device variations with Spice?
Date: Fri, 03 Jan 2003 22:47:48 +0100
Organization: Wanadoo, l'internet avec France Telecom
NNTP-Posting-Date: 3 Jan 2003 21:47:53 GMT
X-Mailer: Mozilla 4.79 [en] (X11; U; Linux 2.4.20 i686)
Jim Thompson wrote:
> On Fri, 03 Jan 2003 21:36:24 +0100,
> "A.Iakovlev" ,
> In Newsgroup: sci.electronics.design,
> Article: <3E15F448.6DB56D48@worldonline.fr>,
> Entitled: "Taking into account device variations with Spice?",
> Wrote the following:
> |Hello Spice gurus,
> |I would like to learn how to evaluate the limits of a circuit's
> |characteristics due to the variation of the parameters of the real world
> |parts, with Spice. I mean the technological variation of a given part
> |type, in the limits specified in the datasheet. I guess that I need to
> |go through the simplest cases first, but my current practical interest
> |is evaluating the maximum THD of a three-bjt circuit, on the space of
> |the technological and temperature variations of all the parts (some
> |resistances, one zener, three bjts). Thanks a lot for any pointers /
> Use Monte Carlo or worst-case.
Is it possible to make it work on THD value (.four analysis) ?
Then, it looks like one has to specify the variation of all the parameters
one by one (DEV/LOT for each parameter); I have not yet seen this in the
manufacturers - provided models... What would be a practical approach for
bjts (the most important parameters?)?
> ...Jim Thompson
> | James E.Thompson, P.E. | mens |
> | Analog Innovations, Inc. | et |
> | Analog/Mixed-Signal ASIC's and Discrete Systems | manus |
> | Phoenix, Arizona Voice:(480)460-2350 | |
> | Jim-T@analog_innovations.com Fax:(480)460-2142 | Brass Rat |
> | http://www.analog-innovations.com | 1962 |
> For proper E-mail replies SWAP "-" and "_"
> I love to cook with wine. Sometimes I even put it in the food.