From: DarkMatter
Newsgroups: sci.electronics.basics,sci.electronics.design,sci.electronics.misc
Subject: Re: Reducing contact resistance for low volt use?
Summary: What do you think of these ping times eh?
Sender: DarkMatter
Organization: thebarattheendoftheuniverse
Reply-To: You can't see me, and I pass right through planets...
Message-ID:
References: <3df66fb5.14200838@news.pipeline.com> <3df68c6f.21555882@news.pipeline.com> <3e190f7b.3476211@news.pipeline.com>
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Date: Tue, 07 Jan 2003 03:56:37 GMT
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NNTP-Posting-Date: Mon, 06 Jan 2003 22:56:37 EST
On Mon, 6 Jan 2003 15:14:13 +0000, John Woodgate
Gave us:
>I read in sci.electronics.design that DarkMatter endoftheuniverse.org> wrote (in com>) about 'Reducing contact resistance for low volt use?', on Mon, 6
>Jan 2003:
>> and goes
>>against our basic rules.
>
>When did you introduce those basic rules and what consultation process
>did you go through?
>
Hey, if you want to separate yourself, and "help" this guy with this,
fine.
>We do occasionally get stuff here about high-energy experiments that
>damage either the test object or the energy source. It's all part of
>life's rich pageant.
Yep. As is doing it right. Destructive testing has it's place. I'd
be willing to bet that the battery makers have more comprehensive data
than he could ever desire. They have the capitol to make the fixtures
right, and the equipment to log the data better. One might even be
able to get said data from them, up to a point.
Attempting it blind is only asking for invalid data.